National Instruments RF-measurement platform gives functional flexibility and wide applications range in the PXI form factor
Increasing production, complexity and functionality of different types of mobile wireless devices demands the expanding of traditional RF measuring instruments bandwidth. A clear understanding of the principles of traditional radio measuring instruments, as well as many limitations associated with their use, allows the majority of engineers to turn to an open software-defined modular architecture for the creation of the RF automated test systems. National Instruments has been developing T&M equipment in the PXI format for RF industry and offering complete measuring systems based on them for more than eight years.
Issue: KIPiS 2011 #1
KIPiS News & Events
|© "Test & Measuring Instruments and Systems" ("KIPiS"), 2000-2020|