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The 50th anniversary of the national metrology system of the USA

August 21-25, 2011, Washington, DC (Gaylord National Convention Center, National Harbor, MD, USA) hosted an international symposium of metrology which gathered more than 2,000 people. The motto of the symposium «50 Years: Reflecting On The Past — Looking To The Future». Review of this event also includes an interview with Victor Sapritskiy, Doctor of technical sciences, Professor, Head of the Laboratory of Photometry in VNIIOFI.

Author(s):  Afonskaya, Tatiana , Afonskiy, Alexander
Issue:  KIPiS 2011 #5

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Current issue
#3 June 2019
KIPiS 2019 #3
Topic of the issue:
Metrology
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