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The use of highly sensitive oscilloscopes with FFT function for localization of increased emission sources within electronic components by the example of Rohde&Schwarz equipment

The present article contains the evaluation of the use of highly sensitive digital oscilloscopes with FFT function for the search of increased emission sources within electronic components. You will get to know about the importance of the problem analyzed as well as the requirements to the measuring means used therefore. The article includes an example that confirms the potential marketability and prospects of the mentioned modern oscilloscopes use.

Author(s):  Lemeshko N.
Issue:  KIPiS 2013 #6

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Current issue
#5 October 2020
KIPiS 2020 #5
Topic of the issue:
Modern instrumentation
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