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Cejer, Mark


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Demand for higher power semi devices will require pushing instrumentation to new extremes

Issue: KIPiS 2014 #4

Although no one can know exactly what the next generation of power semiconductor devices will look like, it’s absolutely certain they will require instrumentation with a broad dynamic range and exceptional low-level leakage measurement capabilities to characterize and test them. As new devices evolve, their manufacturers will continue to explore their options, seeking the best combination of power, performance, and cost-effectiveness available.

 

Current issue
#3 June 2018
KIPiS 2018 #3
Topic of the issue:
Metrology
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