Demand for higher power semi devices will require pushing instrumentation to new extremes
Although no one can know exactly what the next generation of power semiconductor devices will look like, it’s absolutely certain they will require instrumentation with a broad dynamic range and exceptional low-level leakage measurement capabilities to characterize and test them. As new devices evolve, their manufacturers will continue to explore their options, seeking the best combination of power, performance, and cost-effectiveness available.
Author(s): Stauffer, Lee / Cejer, Mark
Issue: KIPiS 2014 #4
KIPiS News & Events
|© "Test & Measuring Instruments and Systems" ("KIPiS"), 2000-2017|