Laser diode array test for 3D sensing with a 2602B or 2606B system SourceMeter® instrument and DMM7510 graphical sampling DMM
The growing demand for distance
and velocity measurements in three-dimensional
space is evident in many industrial
applications. Keithley’s Test
Script Processor and TSP-Link are two
key technologies that enable more efficient
and reliable electrical test for new
applications such as 3D sensing.
Keithley’s TSP-enabled 2602B and
2606B SMUs and DMM7510 allow users
to integrate bench instruments effortlessly
into a holistic system and
achieve industry’s best trigger synchronization
and maximum throughput for
any automated or production environment.
Issue:
KIPiS 2019 #4
