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Laser diode array test for 3D sensing with a 2602B or 2606B system SourceMeter® instrument and DMM7510 graphical sampling DMM

The growing demand for distance and velocity measurements in three-dimensional space is evident in many industrial applications. Keithley’s Test Script Processor and TSP-Link are two key technologies that enable more efficient and reliable electrical test for new applications such as 3D sensing. Keithley’s TSP-enabled 2602B and 2606B SMUs and DMM7510 allow users to integrate bench instruments effortlessly into a holistic system and achieve industry’s best trigger synchronization and maximum throughput for any automated or production environment.

Issue:  KIPiS 2019 #4

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Related Information:

Current issue
#4 August 2020
KIPiS 2020 #4
Topic of the issue:
Modern instrumentation
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