Free Keithley Web-Based Seminar to reveal Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage (C-V) Testing
Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, offers a free, web-based seminar titled "Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage (C-V) Testing".
Two broadcast times
This seminar is a follow-up to the material presented in the “Semiconductor C-V Testing Fundamentals” seminar. It is designed to help laboratory engineers implement, troubleshoot, and verify C-V measurement systems. The seminar will discuss the keys to getting good C-V measurement results. Topics to be discussed include system setup and results from some extended C-V applications, such as high voltage C-V and quasistatic C-V.
Those participating in this seminar will learn:
This seminar is intended for those whose job requires performing C-V measurements. Students, technicians, engineers, and lab managers who are responsible for installing and maintaining C-V equipment and probe stations will also benefit from this seminar.
Speaker: Lee Stauffer, Senior Staff Technologist
Lee Stauffer is Senior Staff Technologist for Keithley Instruments’ Semiconductor Measurements Group, based in Cleveland, Ohio. Prior to joining Keithley, his career included designing satellite communication systems, as well as equipment and product engineering in semiconductor labs.
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“Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage (C-V) Testing” is free to the public. To view the presentation, visit www.keithley.com/events/semconfs/webseminars.
For more information on Keithley or any of its test solutions, visit www.keithley.com
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