There is no newsletter category found.
X-Parameters: the new paradigm for measurement, modeling, and design of nonlinear RF and microwave components
For more than 40 years, S-parameters, or scattering parameters, have been among the most important of all the foundations of microwave theory and techniques. The communications revolution is inexorably forcing active components into more and more strongly nonlinear regimes of preration. X-parameters are the rigorous supersets of S-parameters that are applicable to linear and nonlinear components, excited by small and large-signal conditions
Author(s): David E. Root, Jason Horn, Loren Betts, Chad Gillease, Jan Verspecht
Issue: KIPiS 2009 #2
Read PDF: Read
|© "Test & Measuring Instruments and Systems" ("KIPiS"), 2000-2023|