Tektronix introduces S530 Series Parametric Test System with KTE 7 software to support wide bandgap (WBG) fabrication
11/10/2020 | 149Tektronix, Inc. released the new Keithley S530 Series Parametric Test System with KTE 7 software and other enhancements. The S530 platform enables semiconductor fabs to add parametric test capacity for high-growth new technologies while minimizing CAPEX investment and maximizing wafers per hour efficiency. This reduced overall cost of ownership profile helps manufactures meet aggressive price pressures in competitive new markets.
Tektronix adds industry-first technology which eliminates pulse tuning in new all-in-one 2601B-PULSE System SourceMeter®
06/02/2020 | 290Tektronix, Inc. announced the new 2601B-PULSE System SourceMeter® 10μs Pulser/SMU Instrument, integrating a high-speed current pulser with DC source and measurement functions in one instrument. The new system incorporates PulseMeter™ technology for sourcing current pulses as short as 10μsec at 10A and 10V without the need to manually tune the output to match device impedance up to 3μH.
12/03/2019 | 411Tektronix, Inc. announced the availability of two new source measure unit (SMU) modules for the Keithley 4200A-SCS Parameter Analyzer that can perform low-current measurements even in the presence of high load capacitance due to long cables and complex test setups. Among the notable test applications facing this challenge are LCD display manufacturing and nano FET device testing on a chuck.
New Dual-Channel Multimeter from Tektronix Combines Highest Density with Industry Leading Performance
12/18/2018 | 541Tektronix, Inc., a leading worldwide provider of measurement solutions, introduced the Keithley DMM7512 dual channel 7½-digit sampling multimeter that packs two independent and identical digital multimeters into a low profile 1U high, full rack width space-saving enclosure. Featuring industry leading density and performance, the DMM7512 is ideally suited for a range of demanding high-volume manufacturing test applications that require measurement capacity, performance and a compact footprint.
New Keithley KickStart 2.0 Software Removes Complexity from Multi-Instrument Setup, Fast Data Visualization
07/20/2018 | 528Tektronix, Inc., a leading worldwide provider of measurement solutions, introduced Keithley KickStart 2.0 software that accelerates the path to results and enables quick test set-up and data visualization when using single or multiple instruments. KickStart simplifies what users need to know about instruments so that in just minutes engineers can take instruments out of the box and start gathering real data, complete with plots and quick statistical summaries.
08/26/2013 | 2110The new Keithley Model 2450 Touchscreen Source Measure Unit (SMU) Instrument is ideal for I-V functional test and characterization of a wide range of today's modern electronic devices, including scaled semiconductors, nano-scale devices and materials, organic /printed electronics and other current and voltage testing applications.
Keithley Introduces High Voltage System SourceMeter® Instrument optimized for High Power Semiconductor Test
03/27/2012 | 2503Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, introduced the Model 2657A High Power System SourceMeter® instrument. The Model 2657A adds high voltage to the company’s Series 2600A System SourceMeter® family of high speed, precision source measurement units.
02/29/2012 | 5363This web seminar will explain the basics of how SMU instruments work, describe key features and capabilities to consider for selecting an SMU instrument, and compare the actual performance of different SMU instruments in "real-world" applications.
01/26/2012 | 2305This seminar is focused on examining the benefits and tradeoffs associated with parallel test solutions for wafer level reliability (WLR.) WLR tests are commonly used throughout the semiconductor lifecycle from technology development and process integration to process reliability monitoring. The speed and accuracy of the WLR testing impact time to market for new designs. Parallel WLR testing provides a tool to significantly accelerate throughput by providing statistically significant samples sooner. Parallel WLR test solutions provide throughput benefits for both traditional and advanced WLR measurements.
Free Technical Online Seminar. Meeting the Electrical Measurement Demands of High Power High Brightness LEDs
12/14/2011 | 2161Keithley Instruments invites to attend an online seminar which provides an overview of the electrical test equipment that is required to properly test today’s High Power High Brightness LEDs.
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