State-of-the-art capabilities of jitter analysis in high-speed digital devices using R&S RTO-K12 option
The present article demonstrates the state-of-the-art capabilities of jitter analysis in high-speed digital devices by the example of R&S RTO-K12 option. The author suggests analyzing the reasons that may cause jitter, classification of its components and the main approaches to its reduction, as well as the typical consequences of this phenomenon appearance when operating digital devices. This article also demonstrates the existing methods of jitter analysis and shows examples of measurements using R&S RTO-K12 option to estimate temporal and statistical characteristics of digital signal jitter.
Author(s): Lemeshko N., Strunin P.
Issue: KIPiS 2019 #2
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