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Multipoint measurement mode in AKTAKOM AMM-30x8 component analyzer series
The current article describes the application of the multipoint measurement mode (automatic range or step sweeping) in AKTAKOM AMM-30x8 component analyzer series which expands the capabilities of the device, including semiconductor structures analysis, increases the results reliability and reduces the time it takes for measurements.
Issue: KIPiS 2020 #2
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