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Cejer, Mark
Books of this author
Articles of this author
Demand for higher power semi devices will require pushing instrumentation to new extremes
Issue: KIPiS 2014 #4
Although no one can know exactly what the next generation of power semiconductor devices will look like, it’s absolutely certain they will require instrumentation with a broad dynamic range and exceptional low-level leakage measurement capabilities to characterize and test them. As new devices evolve, their manufacturers will continue to explore their options, seeking the best combination of power, performance, and cost-effectiveness available.
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