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Harnack, Jake

National Instruments

Books of this author

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Articles of this author

Highly Parallel Wafer-Level-Reliability Systems with Modular SMUs

Issue: KIPiS 2016 #6

WLR systems, which have been around for decades, vary in both measurement capability and architecture. Specialized WLR systems may involve high-frequency ac or pulsed stimulus. However, most CMOS devices are tested with dc instruments such as source measure units (SMUs), which supply the necessary stress and measurement capability for collecting parametric data.

Current issue

#4 December 2021
KIPiS 2021 #4

Topic of the issue:

Modern instrumentation