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Morgan, Lee
Books of this author
Articles of this author
Finding relationships between power rail noise and jitter
Issue: KIPiS 2020 #5
To get to the root cause of bit errors,
jitter analysis is the best starting point but
in some cases power rail analysis can
help get to the true root cause. To get to
the bottom of bit errors, we look at jitter
and power rail noise in both the time and
frequency domains.
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A new approach to frequency analysis on oscilloscopes
Issue: KIPiS 2019 #5
Debugging embedded systems often
involves looking for clues that are hard to
discover just by looking at one domain at
a time. The ability to look at time and
frequency domains simultaneously can
offer important insights. To address the
need for RF analysis in its 4, 5 and 6 Series
MSO mixed signal oscilloscopes,
Tektronix is taking a new approach that
does not require a separate input channel.
Recently released firmware unlocks
an analysis tool called Spectrum View
that takes advantage of patented hardware
already in the instruments.
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