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Companies' news
01/10/2017 | 1410
NI (Nasdaq: NATI), the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced the release of its Automated Test Outlook 2017. The annual test and measurement report reviews the key technologies impacting automated test environments from reconfigurable test instrumentation to software-centric test platforms and ecosystems for next-generation device test.
12/30/2016 | 1533
National Instruments (Nasdaq: NATI) announced the appointment of John Roiko as interim chief financial officer (CFO) effective Jan. 1, 2017. Roiko will oversee NI’s global finance organization and continue to report to Alex Davern, NI’s current chief operating officer and CFO, who will become chief executive officer of the company effective Jan. 1.
12/02/2016 | 1391
NI, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced a collaboration with the Defense Advanced Research Projects Agency (DARPA) to supply core infrastructure for a path-breaking channel emulation testbed, called Colosseum, which will play a central role in the DARPA Spectrum Collaboration Challenge.
11/18/2016 | 1578
NI the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced the PXIe-5164 oscilloscope. The PXIe-5164 is built on the open, modular PXI architecture, and includes a user-programmable FPGA to help aerospace/defense, semiconductor and research/physics applications that require high-voltage measurements and high levels of amplitude accuracy.
10/28/2016 | 1538
NI (Nasdaq: NATI), the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced TestStand 2016. This latest version of the industry-leading test management software focuses on helping the more than 10,000 current users to further increase their productivity while also helping to ensure the initial success of new developers.
10/13/2016 | 1562
NI (Nasdaq: NATI), the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced new RF capabilities for higher power transmit and receive, and FPGA-based real-time envelope tracking and digital predistortion for the Semiconductor Test System (STS).
09/30/2016 | 1462
NI, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced the NI Educational Laboratory Virtual Instrumentation Suite (NI ELVIS) RIO Control Module, the newest addition to the powerful NI ELVIS product family. The NI ELVIS RIO Control Module adds an industry-leading, real-time embedded processor and FPGA architecture to instrumentation powering NI’s most complete hands-on learning solution for power systems, machine control, hardware in the loop and mechatronics design.
09/16/2016 | 1483
NI (Nasdaq: NATI), the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced the world’s first MIMO Application Framework.
08/26/2016 | 1458
NI, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced a second-generation vector signal transceiver (VST).The NI PXIe-5840 module is the world’s first 1 GHz bandwidth VST and is designed to solve the most challenging RF design and test applications.
08/09/2016 | 1504
NI, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced the NI PXIe-4135 source measure unit (SMU) with a measurement sensitivity of 10 fA and voltage output up to 200 V. Engineers can use the NI PXIe-4135 SMU to measure low-current signals and take advantage of the high channel density, fast test throughput and flexibility of NI PXI SMUs for applications such as wafer-level parametric test, materials research and characterization of low-current sensors and ICs.
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