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Anritsuís ME7873L LTE RF Conformance Test System Achieves World-First R&TTE verification

Anritsuís ME7873L LTE RF Conformance Test System Achieves World-First R&TTE verification


Anritsu Corporation is pleased to announce that its ME7873L LTE RF Conformance Test System has become the first in the world to provide independently verified European Radio equipment and Telecommunications Terminal Equipment (R&TTE) RF test cases for Type Approval of LTE devices.

“This provides a key function in bringing LTE devices to market, and demonstrates how Anritsu is leading the test industry in providing these critical solutions to the device vendors and test houses. LTE device manufacturers and Test Houses using the ME7873L can now be assured of a compliant and reliable platform for making these tests and ensuring compliance with the relevant EU legislation.” comments Jonathan Borrill, Director of Marketing at Anritsu.

The R&TTE directive is an ETSI standard assuring that the radio transmitter and receiver characteristics of communications terminals and radio equipment are fully compliant with European radio legislation. LTE terminals satisfying the requirements of the R&TTE directive can be used in any EU member state. Now the measurement procedure and accuracy of Anritsu’s ME7873L has been independently fully verified as meeting the European requirements for LTE terminal measurement systems, so LTE terminals measured with the ETSI-approved ME7873L will meet the requirements of the EU R&TTE directive.

The ME7873L† can also be freely configured to meet customersí TRx, performance, and RRM requirements and can be upgraded from the ME7873F W-CDMA RF Conformance Test System. In addition to supporting R&TTE test items, the ME7873L already supports part of the 3GPP TS36.521-1/3 test items and will soon have approval for the GCF/PTCRB work items (WI), facilitating early production rollout of GCF/PTCRB-approved LTE terminals.

Anritsu Corporation (

Company profile:  Anritsu

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Related Information:

Current issue
#4 December 2021
KIPiS 2021 #4
Topic of the issue:
Modern instrumentation