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Agilent Technologies Announces One-Box Solution for High-Speed Serial Interconnect Analysis

Agilent Technologies Announces One-Box Solution for High-Speed Serial Interconnect Analysis


Agilent Technologies introduced the Time Domain Reflectometer (TDR) application software option for the Agilent E5071C ENA network analyzer. The combined E5071C and TDR application software make the ideal one-box solution for high-speed serial interconnect analysis. The E5071C with the TDR option includes three breakthrough features: simple and intuitive operation, fast and accurate measurements, and lower cost of ownership. The one-box solution is used by signal integrity engineers who require efficient design and verification in R&D, quality assurance and manufacturing.

The Agilent E5071C ENA network analyzer offers the highest performance and fastest speed in its class. The E5071C has a wide frequency range up to 20 GHz and versatile functions, making it the ideal solution for manufacturing and R&D engineers evaluating components and circuits. The E5071C with the TDR option provides time domain, frequency domain and simulated eye diagram measurements in a one-box solution.

The user interface for the E5071C with the TDR software provides a similar look-and-feel to a traditional TDR oscilloscope. The TDR software includes a measurement set-up wizard that provides users with a simple and intuitive operation experience. The software offers wider dynamic range and a variety of calibration methods ensuring fast and accurate measurements. With a robust architecture that protects against electrostatic discharge and flexible bandwidth upgrade paths, the E5071C with the TDR option is a one-box solution that reduces the long-term cost of ownership. The one-box solution is designed for use in high-speed PCB, cable assembly and connector testing for serial data applications.

More information about the Agilent E5071C ENA with the TDR application software option can be found at

Company profile:  Keysight Technologies

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Related Information:

Current issue
#4 December 2021
KIPiS 2021 #4
Topic of the issue:
Modern instrumentation