There is no newsletter category found.
NI Helps Cut RF Test Times Significantly for 5G mmWave Over-the-Air (OTA) Validation
NI, the provider of a software-defined platform that helps accelerate the development and performance of automated test and automated measurement systems, announced the launch of a hardware-accelerated 5G mmWave OTA Validation Test reference architecture for thorough characterization and validation of 5G mmWave beamforming AiP devices.
NIís mmWave OTA Validation Test reference architecture achieves fast speeds for OTA spatial sweeps in the 5G mmWave bands from 24 to 44 GHz, helping users significantly reduce OTA RF validation test times for AiP devices, compared to traditional point-by-point, software-controlled test systems. This new reference architecture gives characterization and validation engineers working on the latest 5G AiP devices the advantage of addressing their devicesí beamforming performance with wider and more complex 5G NR signals while shortening development schedules. NIís fast OTA test approach helps engineers use denser spatial grids and obtain finer 3D spatial resolution while keeping test times low. Furthermore, with NIís mmWave OTA Validation Test Software, validation engineers can quickly configure these extensive spatial sweeps to characterize their deviceís antenna patterns as they produce, visualize, store or distribute detailed parametric results.
ďIn the rapidly evolving 5G mmWave semiconductor industry, test systems need to be ready for a new class of 5G beamforming devices,Ē said Alastair Upton, chief strategy officer at Anokiwave. ďEngineers will need fast, accurate and fairly-priced tools to measure and ensure device beamforming performance so that the next generation of mmWave semiconductors can reach its global potential.Ē
NIís mmWave OTA Validation Test reference architecture includes:
Company profile: National Instruments
KIPiS News & Events
|© "Test & Measuring Instruments and Systems" ("KIPiS"), 2000-2023|