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Expo Control 2010

Expo Control 2010


International exhibition of scientific, measuring & testing equipment and systems Expo Control 2010 devoted to one of the most important directions in the industrial production and manufacturing — quality assurance.

The innovative concept meets the high requirements of trade and professional visitors and offers a varied up-to-date and compact overview of products and solutions presented: from materialographic & other scientific researches to measurement and testing methods and technologies for materials, designs, complex mechanisms; from electronic testing systems to components and systems for analysis apparatus and other quality assurance of products and systems.

Event Profile

Automating measurements & testing: automating testing bench, automating measurement system, automated test equipment (ATE); automating data recording, management, transmission while bench and field tests; software test & development and many more.

Testing systems: acoustic; vibration; dynamic; electromagnetic compatibility; material testing; testing of electronic components & apparatus; climatic; mechanical; modal analysis; fatigue/fracture testing; metallographic analysis; static; heat; airfree; physical; impact test; endurance; electrical and many more.

Measuring systems: computer reverse engineer; metrological assurance; test simulation; telemetry subsystem; noncontact sensing and optoelectronics: sensors, laser, fiber optics technology, industrial image processing, optoelectronic measurement and many more.

Special testing systems: hydraulics testing; air data testing; crash test analysis; aerodynamic & windtunnel testing; electrical system testing; component testing; eddy current testing; avionics testing & simulation; space systems testing; torsion testing; propulsion/engine testing; fuels and integrated systems testing; dye penetrant testing; digital conductivity testing; sensors & transducers; laser shearography; borescopes & fiberscopes and many more.

Non-destructive testing and chemical analysis apparatus: optical microscopy; X-ray crystal analysis; thermal analysis; chemical analysis; chromatography and many more.

More information about the event available at

Start date:  04/27/2010
End date:  04/29/2010
Venue:  World Trade Center, Moscow, Russia
Organizer:  Rual Interex

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#4 December 2021
KIPiS 2021 #4
Topic of the issue:
Modern instrumentation