Pulse testing principles for emerging non-volatile memory technologies
Emerging NVM materials and device types require electrical characterization that traditionally has not been available or required custom in-house test systems, which had limited capabilities. New instrumentation is now available that provides pulse sourcing with simultaneous measurement that permits characterization of the underlying switching behavior that is key to understanding NVM performance.
Author(s): Hulbert, Peter J.
Issue: KIPiS 2014 #1
KIPiS News & Events
|© "Test & Measuring Instruments and Systems" ("KIPiS"), 2000-2021|