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Shumskiy I.
Books of this author
Articles of this author
Revisiting the optimal choice of oscilloscopes for production tasks
Issue: KIPiS 2018 #5
Some time ago «NPP Eliks» ÑJSC
company got the request from one of its
long-term partner to supply low cost and
at the same time high-performance oscilloscopes
for the organization production
line. Earlier the organization had used
Tektronix TDS2012C oscilloscopes
which fully met the customer’s requirements.
But the progress always goes forward
and with time there have come new
oscilloscope models which have the similar
or higher specifications and sometimes
even lower price. Therefore the
specialists of Eliks company offered several
scopes of the same class and demonstrated
the detailed presentations letting
the customer make the right choice…
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Semiconductor C-V characteristic measurement — choosing up-to-date low-cost solution
Issue: KIPiS 2017 #2
Semiconductor electrophysics of today
can hardly be imagined without C-V
characteristic measurement meaning the
capacitance measurement as a function
of the applied direct offset voltage. This
very measurement allows quickly identifying
the basic parameters of semiconductor
and dielectric layers which direct
measurement is considered a rather complicated
process. You will find more details
in the present article and also get to
know about the use of AKTAKOM LCR
analyzers for semiconductor C-V measurement.
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Sampling in the digital oscilloscope
Issue: KIPiS 2016 #6
We keep on publishing a series of articles
devoted to the main principles of
choosing a digital oscilloscope for your
measurement tasks. In the current article
we would like to draw your attention to
the sampling as the main characteristic of
digital oscilloscopes, namely how the
mode, number of digits and sampling
rate affect the measurement results.
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Digital oscilloscope inputs and outputs use for integration into the measuring system
Issue: KIPiS 2016 #5
Nowadays it’s quite common to use a digital oscilloscope jointly with other devices for complex measurements and further data processing within a measuring system. However to integrate an oscilloscope into the complex measuring system there are some other additional technical capabilities required besides data transferring to PC or the local network. The current article in a very detail demonstrates the main of such capabilities and gives you examples of oscilloscope operation within the complex systems.
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