Free technical online seminar. Understanding the Basics of Parallel Wafer Level Reliability (WLR)
Attendance to participate in this important industry event is free.
This seminar is focused on examining the benefits and tradeoffs associated with parallel test solutions for wafer level reliability (WLR.) WLR tests are commonly used throughout the semiconductor lifecycle from technology development and process integration to process reliability monitoring. The speed and accuracy of the WLR testing impact time to market for new designs. Parallel WLR testing provides a tool to significantly accelerate throughput by providing statistically significant samples sooner. Parallel WLR test solutions provide throughput benefits for both traditional and advanced WLR measurements.
By participating in this seminar, you will learn and understand:
This seminar is recommended for engineers who are new to semiconductor reliability testing, test engineers who need to accelerate WLR testing, and QRA lab managers.
About the Presenter:
Dave Rose is a senior staff applications engineer at Keithley Instruments, Inc. in Cleveland, Ohio. Dave joined Keithley in 1987 and has spent roughly half of his career in design engineering and the other half in applications engineering.
When is it?
Europe: Thursday, January 26, 2012
15:00 CET Central European Time
How Do I Register?
The seminar will be broadcasted over the internet and requires your registration prior to the event.
Register today to reserve your place for this invaluable seminar!
Attendance to participate in this important industry event is free, but space is limited, so sign up now!
To register for this webcast seminar click here.
You will receive confirmation and log-in information prior to the event.
Don’t miss your chance to learn more about this important topic!
Live Broadcast at 15:00 Central European Time on Thursday, January 26, 2012.
Keithley Instruments, www.keithley.com
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