News from Anritsu(145)
News from Fluke(23)
News from Keithley(33)
News from Keysight Technologies(349)
News from Metrel(0)
News from National Instruments(145)
News from Pendulum(14)
News from Rigol(10)
News from Rohde & Schwarz(284)
News from Tektronix(157)
News from Texas Instruments(90)
News from Yokogawa(41)
Keithley Instruments
Keysight Technologies
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Texas Instruments
Forgot your password?

Free Keithley Web-Based Seminar Explores the Basics of Ultra-Fast I-V Device Characterization

Free Keithley Web-Based Seminar Explores the Basics of Ultra-Fast I-V Device Characterization


Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Fundamentals of Ultra-Fast I-V Device Characterization" on Thursday, April 29, 2010.

This one-hour presentation will examine the increasing importance of Ultra-Fast Current-Voltage (I-V) characterization across a broad spectrum of device and process technologies. Common applications include non-volatile memory devices (NVM) such as Flash and phase change memory, isothermal characterization on silicon-on-insulator (SOI) devices and compound semiconductors, and transient characteristics of new materials such as high-K dielectrics.

Date and time

  • Thursday, April 29, 2010 at 15:00 CEST (9:00 a.m. EDT) for the European audience
  • Thursday, April 29, 2010 at 2:00 p.m. EDT for the North American audience

To register for this event, visit

Fundamentals of Ultra-Fast I-V Device Characterization will cover a core description of the measurement hardware and setups, including cabling to a probe station. The seminar will also discuss typical test setups and common error sources. Finally, some practical examples of device measurements will be given. Participants will also have the opportunity to ask questions during the event.

Fundamentals of Ultra-Fast I-V Device Characterization is recommended for students, researchers, and engineers doing characterization of materials, processes, and devices; lab managers wanting to learn about this useful measurement technique; and engineers doing device and material reliability studies (for example, WLR, ESD, latchup, etc.).

The seminar will be presented by Lee Stauffer, a senior staff technologist for Keithley Instruments' Semiconductor Measurements Group in Cleveland, Ohio. Prior to joining Keithley, Stauffer's career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.

The seminar will also be archived on Keithley's website for those unable to attend the original broadcast.

For more information on Keithley or any of its test solutions, visit

Company profile:  Keithley Instruments

Back to the list

Related Information:

Current issue
#4 December 2021
KIPiS 2021 #4
Topic of the issue:
Modern instrumentation